Research Catalog
Practical surface analysis : by auger and x-ray photoelectron spectroscopy
- Title
- Practical surface analysis : by auger and x-ray photoelectron spectroscopy / edited by D. Briggs and M.P. Seah.
- Publication
- Chichester ; New York : Wiley, ©1983.
Items in the Library & Off-site
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1 Item
Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Book/Text | Use in library | TP156.S95 P73 1983 | Off-site |
Details
- Additional Authors
- Description
- xiv, 533 pages : illustrations; 24 cm
- Subject
- Bibliography (note)
- Includes bibliographical references and index.
- Contents
- A PERSPECTIVE ON THE ANALYSIS OF SURFACES AND INTERFACES / M.P. Seah and D. Briggs: The background to electron beam techniques -- The background to photon beam techniques -- The background to ion beam techniques -- INSTRUMENTATION / J.C. Riviere: Vacuum conditions -- Sample Handling -- Sources -- Electron energy analysers -- SPECTRAL INTERPRETATION / D. Briggs and J.C. Riviere: The Electron-excited secondary electron spectrum -- The X-ray photo electron spectrum -- DEPTH PROFILING / S. Hofmann: Practice of depth profiling with AES and XPS -- Quantification of sputtering profiles -- Sputtering profile compared to the original concentration profile: the concept of depth resolution -- Special profiling techniques -- Deconvolution procedures for sputtering profiles -- QUANTIFICATION OF AES AND XPS / M.P. Seah: Quantification of AES for homogeneous binary solids -- Quantification of XPS for homogeneous binary solids -- Quantification of samples with thin overlayers -- Quantification in sputter-depth profiles -- APPLICATIONS OF AES IN MICROELECTRONICS / R.R. Olson et al.: Silicon microelectronics technology -- Other microelectronics technologies -- AES IN METALLURGY / M.P. Seah: Characterization of segregation -- Theory of segregation -- Materials effects of segregation -- APPLICATIONS OF ELECTRON SPECTROSCOPY TO HETEROGENEOUS CATALYSIS / T.L. Barr: Fundamentals of electron spectroscopy-as applied to catalysis -- Electron spectroscopy and applied catalysis -- APPLICATIONS OF XPS IN POLYMER TECHNOLOGY / D. Briggs: Sample handling -- Instrumentation -- Spectral information -- Comparison of XPS with other techniques -- Application of XPS to polymer surface analysis problems -- USES OF AUGER ELECTRON AND PHOTOELECTRON SPECTROSCOPIES IN CORROSION SCIENCE / N.S. McIntyre: Special aspects of XPS and AES for corrosion studies -- Review of XPS and AES applications in corrosion science.
- ISBN
- 047126279X
- 9780471262794
- LCCN
- 83006618
- OCLC
- ocm09556397
- 9556397
- SCSB-611844
- Owning Institutions
- Princeton University Library