Research Catalog

Practical surface analysis : by auger and x-ray photoelectron spectroscopy

Title
Practical surface analysis : by auger and x-ray photoelectron spectroscopy / edited by D. Briggs and M.P. Seah.
Publication
Chichester ; New York : Wiley, ©1983.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
Request for On-site UseRequest Scan
How do I pick up this item and when will it be ready?
Book/TextUse in library TP156.S95 P73 1983Off-site

Details

Additional Authors
  • Briggs, D. (David), 1948-
  • Seah, M. P.
Description
xiv, 533 pages : illustrations; 24 cm
Subject
  • Surfaces (Technology) > Analysis
  • Electron spectroscopy
  • Auger-Spektroskopie
  • Oberflächenanalyse
  • Röntgen-Photoelektronenspektroskopie
  • Elektronenspektroskopie
  • Festkörperoberfläche
  • Photoelektronenspektroskopie
  • Surfaces (Technology)
  • Photoelectron spectroscopy
Bibliography (note)
  • Includes bibliographical references and index.
Contents
A PERSPECTIVE ON THE ANALYSIS OF SURFACES AND INTERFACES / M.P. Seah and D. Briggs: The background to electron beam techniques -- The background to photon beam techniques -- The background to ion beam techniques -- INSTRUMENTATION / J.C. Riviere: Vacuum conditions -- Sample Handling -- Sources -- Electron energy analysers -- SPECTRAL INTERPRETATION / D. Briggs and J.C. Riviere: The Electron-excited secondary electron spectrum -- The X-ray photo electron spectrum -- DEPTH PROFILING / S. Hofmann: Practice of depth profiling with AES and XPS -- Quantification of sputtering profiles -- Sputtering profile compared to the original concentration profile: the concept of depth resolution -- Special profiling techniques -- Deconvolution procedures for sputtering profiles -- QUANTIFICATION OF AES AND XPS / M.P. Seah: Quantification of AES for homogeneous binary solids -- Quantification of XPS for homogeneous binary solids -- Quantification of samples with thin overlayers -- Quantification in sputter-depth profiles -- APPLICATIONS OF AES IN MICROELECTRONICS / R.R. Olson et al.: Silicon microelectronics technology -- Other microelectronics technologies -- AES IN METALLURGY / M.P. Seah: Characterization of segregation -- Theory of segregation -- Materials effects of segregation -- APPLICATIONS OF ELECTRON SPECTROSCOPY TO HETEROGENEOUS CATALYSIS / T.L. Barr: Fundamentals of electron spectroscopy-as applied to catalysis -- Electron spectroscopy and applied catalysis -- APPLICATIONS OF XPS IN POLYMER TECHNOLOGY / D. Briggs: Sample handling -- Instrumentation -- Spectral information -- Comparison of XPS with other techniques -- Application of XPS to polymer surface analysis problems -- USES OF AUGER ELECTRON AND PHOTOELECTRON SPECTROSCOPIES IN CORROSION SCIENCE / N.S. McIntyre: Special aspects of XPS and AES for corrosion studies -- Review of XPS and AES applications in corrosion science.
ISBN
  • 047126279X
  • 9780471262794
LCCN
83006618
OCLC
  • ocm09556397
  • 9556397
  • SCSB-611844
Owning Institutions
Princeton University Library