Research Catalog

The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984

Title
The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
Author
International Test Conference (15th : 1984 : Philadelphia, Pa.)
Publication
Silver Spring, MD : IEEE Computer Society Press, ©1984.

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Details

Additional Authors
  • IEEE Computer Society. Test Technology Committee.
  • Institute of Electrical and Electronics Engineers. Philadelphia Section.
Description
xxxi, 886 pages : illustrations; 28 cm
Alternative Title
  • International Test Conference 1984 proceedings.
  • 3 faces of test.
Subjects
Genre/Form
  • Congress
  • Conference papers and proceedings.
  • Actes de congrès.
Note
  • Cover and spine title: IEEE 1984 test conference.
  • "IEEE catalog no. 84CH2084-2."
  • "Computer Society order no. 548."
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
  • 0818605480
  • 9780818605482
  • 0818645482
  • 9780818645488
  • 0818685484
  • 9780818685484
LCCN
84081879
OCLC
  • ocm11488661
  • 11488661
  • SCSB-626525
Owning Institutions
Princeton University Library