Research Catalog

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

Title
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.
Publication
Pittsburgh, Pa. : Materials Research Society, ©1985.

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Details

Additional Authors
  • Johnson, Noble M.
  • Bishop, Stephen G.
  • Watkins, George D.
  • Materials Research Society.
Description
xv, 604 pages : illustrations; 24 cm.
Series Statement
Materials Research Society symposia proceedings, 0272-9172 ; v. 46
Uniform Title
Materials Research Society symposia proceedings ; v. 46.
Subject
  • Semiconductors > Defects > Congresses
  • Semiconductors > Microscopy > Congresses
  • Microscopy > Congresses
  • Microscopy
  • Semiconductors > Defects
Genre/Form
Conference papers and proceedings
Bibliography (note)
  • Includes bibliographies and indexes.
ISBN
  • 0931837111
  • 9780931837111
LCCN
85019753
OCLC
  • ocm12557554
  • 12557554
  • SCSB-9331981
Owning Institutions
Princeton University Library