Research Catalog

LSI/VLSI testability design

Title
LSI/VLSI testability design / Frank F. Tsui.
Author
Tsui, Frank F.
Publication
New York : McGraw-Hill, ©1987.

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TextUse in library TK7874 .T78 1987Off-site

Details

Description
xv, 702 pages : illustrations; 24 cm
Subject
  • Integrated circuits > Large scale integration > Testing
  • Integrated circuits > Very large scale integration > Testing
  • Integrated circuits > Large scale integration > Testing
  • Integrated circuits > Very large scale integration > Testing
  • Entwurf
  • Integrierte Schaltung
  • Prüftechnik
Note
  • Includes index.
Bibliography (note)
  • Bibliography: p. 585-684.
ISBN
  • 0070653410
  • 9780070653412
LCCN
86003005
OCLC
  • ocm13327973
  • 13327973
  • SCSB-1155671
Owning Institutions
Princeton University Library