Research Catalog
Stress-induced phenomena in metallization : Sixth International Workshop on Stress-Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001
- Title
- Stress-induced phenomena in metallization : Sixth International Workshop on Stress-Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001 / editors, Shefford P. Baker [and others].
- Author
- International Workshop on Stress-Induced Phenomena in Metallization (6th : 2001 : Ithaca, N.Y.)
- Publication
- Melville, NY : American Institute of Physics, 2002.
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Book/Text | Use in library | TK7871.85 .S768 2002 | Off-site |
Details
- Additional Authors
- Baker, Shefford P.
- Description
- ix, 250 pages : illustrations; 25 cm.
- Series Statement
- AIP conference proceedings, 0094-243X ; v. 612
- Uniform Title
- AIP conference proceedings ; no. 612.
- Subject
- Integrated circuits > Defects > Congresses
- Thin film devices > Defects > Congresses
- Electrodiffusion > Congresses
- Semiconductors > Defects > Congresses
- Metallic films > Congresses
- Aluminum films > Congresses
- Metallizing > Congresses
- Electrodiffusion
- Integrated circuits > Defects
- Thin film devices > Defects
- Metallic films > Electric properties > Congresses
- Thin film devices > Congresses
- Aluminum films > Electric properties > Congresses
- Genre/Form
- Conference papers and proceedings.
- Bibliography (note)
- Includes bibliographical references and index.
- Additional Formats (note)
- Also available in an electronic version.
- Contents
- Electromigration stresses and mechanisms -- Cyclic loading effects -- Stress voiding -- Deformation and stresses.
- ISBN
- 073540058X
- 9780735400580
- LCCN
- 2002102851
- OCLC
- ocm49723827
- 49723827
- SCSB-1257157
- Owning Institutions
- Princeton University Library