Research Catalog

Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts

Title
Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts / Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center.
Publication
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.

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Details

Additional Authors
  • Chen, Michael J. W.
  • Thibadeau, Robert.
  • Society of Photo-optical Instrumentation Engineers.
Description
vi, 256 p. : ill.; 28 cm.
Series Statement
Proceedings of SPIE--the International Society for Optical Engineering ; v. 730
Subject
  • Engineering inspection > Automation > Congresses
  • Quality control > Optical methods > Congresses
Bibliography (note)
  • Includes bibliographies and index.
ISBN
089252765X (pbk.)
LCCN
86063732
OCLC
  • ocm15973263
  • SCSB-1190012
Owning Institutions
Princeton University Library