Research Catalog

Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida

Title
Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida / Ravi Jain, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.
Publication
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.

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Details

Additional Authors
  • Jain, Ravi.
  • Society of Photo-Optical Instrumentation Engineers.
  • Metallurgical Society (U.S.)
Description
x, 359 p. : ill.; 28 cm.
Series Statement
  • Critical reviews of optical science and technology
  • SPIE ; v. 795
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 795.
Subject
  • Very high speed integrated circuits > Congresses
  • Integrated circuits > Testing > Congresses
  • Semiconductors > Testing > Congresses
Bibliography (note)
  • Includes bibliographies and index.
ISBN
0892528303
OCLC
  • ocm17560023
  • SCSB-1706662
Owning Institutions
Princeton University Library