Research Catalog
Electron microscopy and microanalysis of crystalline materials
- Title
- Electron microscopy and microanalysis of crystalline materials / edited by J.A. Belk.
- Publication
- London : Applied Science Publishers, ©1979.
Items in the Library & Off-site
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1 Item
Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Use in library | QD906.7.E37 E43 | Off-site |
Details
- Additional Authors
- Belk, J. A.
- Description
- x, 240 pages : illustrations; 23 cm
- Subject
- Bibliography (note)
- Includes bibliographical references and index.
- Contents
- Principles of electron optics / W. James -- Electron diffraction / J. A. Belk -- Precipitation studies / G. W. Lorimer -- The application of transmission electron microscopy to the study of plastic deformation / M. H. Loretto and R. E. Smallman -- scanning electron microscopy / C. G. van Essen -- instrumentation in electron probe microanalysis / W. J. M. Salter -- Quantitative microanalysis / C. W. Haworth -- Applications of electron probe microanalysis / J. A. Belk -- Kossel X-ray microdiffraction / N. Swindells.
- ISBN
- 0853348162
- 9780853348160
- LCCN
- 79321602
- OCLC
- ocm05991206
- 5991206
- SCSB-9260875
- Owning Institutions
- Princeton University Library