Research Catalog
Surface characterization and testing II : 10-11 August 1989, San Diego, California
- Title
- Surface characterization and testing II : 10-11 August 1989, San Diego, California / John E. Greivenkamp, Matt Young, chairs/editors.
- Publication
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1989.
Items in the Library & Off-site
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1 Item
Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Book/Text | Use in library | TA418.7 .S79 1989 | Off-site |
Details
- Additional Authors
- Description
- vi, 271 pages : illustrations; 28 cm.
- Series Statement
- Proceedings / SPIE--the International Society for Optical Engineering ; v. 1164
- Uniform Title
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 1164.
- Subject
- Genre/Form
- Conference papers and proceedings.
- Note
- Part of a four-conference program on Interferometry, Microscopy, and Testing held at SPIE's 33rd annual International Symposium on Optical & Optoelectronic Applied Science & Engineering, 6-11 Aug. 1989.
- Bibliography (note)
- Includes bibliographical references.
- ISBN
- 0819402001
- 9780819402004
- LCCN
- 89043274
- OCLC
- ocm20989391
- 20989391
- SCSB-1742587
- Owning Institutions
- Princeton University Library