Research Catalog

Surface characterization and testing II : 10-11 August 1989, San Diego, California

Title
Surface characterization and testing II : 10-11 August 1989, San Diego, California / John E. Greivenkamp, Matt Young, chairs/editors.
Publication
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1989.

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Details

Additional Authors
  • Greivenkamp, John E.
  • Young, Matt, 1941-
  • Society of Photo-Optical Instrumentation Engineers.
Description
vi, 271 pages : illustrations; 28 cm.
Series Statement
Proceedings / SPIE--the International Society for Optical Engineering ; v. 1164
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 1164.
Subject
  • Surfaces (Technology) > Testing > Congresses
  • Surfaces (Technology) > Optical properties > Congresses
  • Surfaces (Technology) > Optical properties
  • Surfaces (Technology) > Testing
  • OPTICAL MEASUREMENT
  • SURFACES
  • TESTS
  • OPTICAL PROPERTIES
  • INTERFEROMETRY
  • CONFERENCES
Genre/Form
Conference papers and proceedings.
Note
  • Part of a four-conference program on Interferometry, Microscopy, and Testing held at SPIE's 33rd annual International Symposium on Optical & Optoelectronic Applied Science & Engineering, 6-11 Aug. 1989.
Bibliography (note)
  • Includes bibliographical references.
ISBN
  • 0819402001
  • 9780819402004
LCCN
89043274
OCLC
  • ocm20989391
  • 20989391
  • SCSB-1742587
Owning Institutions
Princeton University Library