Research Catalog

National Semiconductor Metrology Program : [catalog]

Title
National Semiconductor Metrology Program : [catalog] / EEEL, Semiconductor Electronics Division, Office of Microelectronics Programs [i.e. National Semiconductor Metrology Program].
Author
National Semiconductor Metrology Program (U.S.)
Publication
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995-

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Details

Additional Authors
  • National Institute of Standards and Technology (U.S.)
  • National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs.
  • Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology)
Publication Date
Mar. 1995-
Description
v.; 28 cm.
Series Statement
NIST list of publications ; LP 103
Uniform Title
NIST list of publications ; 103.
Alternative Title
National Semiconductor Metrology Program and Semiconductor Electronics Division publications.
Subject
  • National Semiconductor Metrology Program (U.S.) > Bibliography > Catalogs
  • Semiconductors > Measurement > Bibliography > Catalogs
Genre/Form
Catalogs.
Note
  • Title from cover.
Numbering (note)
  • Each issue cumulates from 1990 (i.e., v. for Mar. 1995 covers period 1990-1994).
Additional Formats (note)
  • Titles for the latest year (not cumulative) also available via Internet from the EEEL web site. Address as of 9/8/00: http://www.eeel.nist.gov/810.01/; current access is available via PURL.
  • Also issued online.
LCCN
sn 95027357
OCLC
  • ocm32519278
  • SCSB-1510014
Owning Institutions
Princeton University Library