Research Catalog

Fault-tolerance through reconfiguration of VLSI and WSI arrays

Title
Fault-tolerance through reconfiguration of VLSI and WSI arrays / R. Negrini, M.G. Sami, R. Stefanelli.
Author
Negrini, R.
Publication
Cambridge, Mass. : MIT Press, ©1989.

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TextUse in library QA76.9.F38 N44 1989Off-site

Details

Additional Authors
  • Sami, Mariagiovanna.
  • Stefanelli, Renato.
Description
301 pages : illustrations; 24 cm.
Series Statement
MIT Press series in computer systems
Uniform Title
MIT Press series in computer systems.
Alternative Title
Fault tolerance through reconfiguration in VLSI and WSI arrays
Subject
  • Integrated circuits > Fault tolerance
  • Integrated circuits > Very large scale integration
  • Integrated circuits > Wafer-scale integration
  • Integrated circuits > Fault tolerance
  • Integrated circuits > Very large scale integration
  • Integrated circuits > Wafer-scale integration
  • Fehlertoleranz
  • VLSI
  • Wafer-Integration
Note
  • Cover title: Fault tolerance through reconfiguration in VLSI and WSI arrays.
Bibliography (note)
  • Includes bibliographies and indexes.
ISBN
  • 0262140446
  • 9780262140447
LCCN
88023225
OCLC
  • ocm18290085
  • 18290085
  • SCSB-1745851
Owning Institutions
Princeton University Library