Research Catalog
Testing and reliable design of CMOS circuits
- Title
- Testing and reliable design of CMOS circuits / by Niraj K. Jha. and Sandip Kundu.
- Author
- Jha, Niraj K.
- Publication
- Boston : Kluwer Academic Publishers, ©1990.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Use in library | TK7871.99.M44 J49 1990 | Off-site |
Details
- Additional Authors
- Kundu, Sandip.
- Description
- xii, 231 pages : illustrations; 25 cm.
- Series Statement
- Kluwer international series in engineering and computer science ; SECS 88. VLSI, computer architecture, and digital signal processing
- Uniform Title
- Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing ; SECS 88.
- Subject
- Metal oxide semiconductors, Complementary > Testing
- Metal oxide semiconductors, Complementary > Reliability
- Integrated circuits > Very large scale integration > Design and construction
- CMOS-Schaltung
- Entwurf
- Prüftechnik
- Zuverlässigkeit
- MOS complémentaires > Essais
- Circuits intégrés à très grande échelle > Essais
- Bibliography (note)
- Includes bibliographical references.
- ISBN
- 0792390563
- 9780792390565
- LCCN
- 89037031
- OCLC
- ocm20490432
- 20490432
- SCSB-9360765
- Owning Institutions
- Princeton University Library