Research Catalog

Tests, measurements, and characterization of electro-optic devices and systems : 8 September 1989, Boston, Massachusetts

Title
Tests, measurements, and characterization of electro-optic devices and systems : 8 September 1989, Boston, Massachusetts / Shekhar G. Wadekar, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.].
Publication
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1990.

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Details

Additional Authors
  • Wadekar, Shekhar G.
  • Society of Photo-optical Instrumentation Engineers.
  • New Mexico State University. Applied Optics Laboratory.
Description
vi, 196 p. : ill.; 28 cm.
Series Statement
SPIE proceedings series ; v. 1180
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 1180.
Subject
  • Electrooptical devices > Congresses
  • Electrooptics > Congresses
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0819402168
OCLC
  • ocm21114125
  • SCSB-1906312
Owning Institutions
Princeton University Library