Research Catalog
Tests, measurements, and characterization of electro-optic devices and systems : 8 September 1989, Boston, Massachusetts
- Title
- Tests, measurements, and characterization of electro-optic devices and systems : 8 September 1989, Boston, Massachusetts / Shekhar G. Wadekar, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.].
- Publication
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1990.
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Status | Format | Access | Call Number | Item Location |
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Text | Use in library | TA1750 .T477 | Off-site |
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Details
- Additional Authors
- Description
- vi, 196 p. : ill.; 28 cm.
- Series Statement
- SPIE proceedings series ; v. 1180
- Uniform Title
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 1180.
- Subject
- Bibliography (note)
- Includes bibliographical references and index.
- ISBN
- 0819402168
- OCLC
- ocm21114125
- SCSB-1906312
- Owning Institutions
- Princeton University Library