Research Catalog

Reliability of microtechnology : interconnects, devices, and systems

Title
Reliability of microtechnology : interconnects, devices, and systems / Johan Liu ... [et al.].
Publication
New York ; London : Springer, c2011.

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StatusFormatAccessCall NumberItem Location
Book/TextUse in library TK7875 .R45 2011Off-site

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Details

Additional Authors
Liu, Johan.
Description
xiii, 204 p. : ill.; 24 cm.
Subject
  • Microtechnology
  • Microtechnology > Reliability
  • Microelectromechanical systems
  • Nanotechnology
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
  • 9781441957597 (hbk.)
  • 1441957596 (hbk.)
LCCN
2011920685
OCLC
  • ocn473464929
  • SCSB-9333813
Owning Institutions
Princeton University Library