Research Catalog
Reliability of microtechnology : interconnects, devices, and systems
- Title
- Reliability of microtechnology : interconnects, devices, and systems / Johan Liu ... [et al.].
- Publication
- New York ; London : Springer, c2011.
Items in the Library & Off-site
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Book/Text | Use in library | TK7875 .R45 2011 | Off-site |
Holdings
Details
- Additional Authors
- Liu, Johan.
- Description
- xiii, 204 p. : ill.; 24 cm.
- Subject
- Bibliography (note)
- Includes bibliographical references and index.
- ISBN
- 9781441957597 (hbk.)
- 1441957596 (hbk.)
- LCCN
- 2011920685
- OCLC
- ocn473464929
- SCSB-9333813
- Owning Institutions
- Princeton University Library