Research Catalog
Critical phenomena at surfaces and interfaces : evanescent X-ray and neutron scattering
- Title
- Critical phenomena at surfaces and interfaces : evanescent X-ray and neutron scattering / Helmut Dosch.
- Author
- Dosch, Helmut, 1955-
- Publication
- Berlin ; New York : Springer-Verlag, ©1992.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Use in library | Q111 .E7 vol.126 | Off-site |
Details
- Description
- x, 145 pages : illustrations; 25 cm.
- Series Statement
- Springer tracts in modern physics ; 126
- Uniform Title
- Springer tracts in modern physics ; 126.
- Subject
- Surfaces (Physics) > Optical properties
- Critical phenomena (Physics)
- X-rays > Scattering
- Neutrons > Scattering
- Grazing incidence
- x-ray scattering
- Festkörperoberfläche
- Kritische magnetische Neutronenstreuung
- Kritisches Phänomen
- Neutronenstrahlung
- Neutronenstreuung
- Röntgenstrahlung
- Röntgenstreuung
- Streifender Einfall
- Totalreflexion
- Phénomènes critiques (physique)
- Surfaces (physique) > Propriétés optiques
- Neutrons > Diffusion
- Interfaces (sciences physiques)
- Rayons X > Diffusion
- Incidence rasante
- Bibliography (note)
- Includes bibliographical references and index.
- Additional Formats (note)
- Also available in an electronic version.
- ISBN
- 0387545344
- 9780387545349
- 3540545344
- 9783540545347
- LCCN
- 91037384
- OCLC
- ocm24630749
- 24630749
- SCSB-1947771
- Owning Institutions
- Princeton University Library