Research Catalog

X rays in materials analysis II : novel applications and recent developments : 25-26 July 1991, San Diego, California

Title
X rays in materials analysis II : novel applications and recent developments : 25-26 July 1991, San Diego, California / Dennis M. Mills, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, Aviation Security Research & Development Service, FAA Technical Center.
Publication
Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1991.

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Details

Additional Authors
  • Mills, Dennis M.
  • Society of Photo-optical Instrumentation Engineers.
  • Federal Aviation Administration Technical Center (U.S.). Aviation Security Research & Development Service.
  • International Symposium on Optical Applied Science and Engineering (1991 : San Diego, Calif.)
Description
viii, 172 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series ; v. 1550
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 1550.
Alternative Title
  • X rays in materials analysis--novel applications and recent developments II
  • X-ray and EUV technologies.
Subject
  • Radiography, Industrial > Congresses
  • X-rays > Industrial applications > Congresses
  • Materials > Analysis > Congresses
  • X-ray spectroscopy > Congresses
  • Nondestructive testing > Congresses
  • Materials > Testing > Congresses
  • Materials > Analysis
  • Materials > Testing
  • Nondestructive testing
  • Radiography, Industrial
  • X-ray spectroscopy
  • X-rays > Industrial applications
Genre/Form
Conference papers and proceedings.
Note
  • "Conference 1550 ... was part of a five-conference program on X-Ray and EUV Technologies, held at SPIE's 1991 International Symposium on Optical Applied Science and Engineering, 21-26 July 1991, in San Diego, California."--P. v.
Bibliography (note)
  • Includes bibliographical references and index.
Contents
X-ray diffraction and x-ray imaging -- X-ray spectroscopy -- Surfaces, interfaces, and thin films.
ISBN
  • 0819406783
  • 9780819406781
LCCN
91062628
OCLC
  • ocm25915082
  • 25915082
  • SCSB-1958590
Owning Institutions
Princeton University Library