Research Catalog

Title

Statistics in industry / edited by R. Khattree, C.R. Rao.

Publication

Amsterdam ; Boston : Elsevier, 2003.

Items in the Library & Off-site

Details

Additional Authors

• Khattree, Ravindra.
• Rao, C. Radhakrishna (Calyampudi Radhakrishna), 1920-2023

Description

xxi, 1187 pages : illustrations; 25 cm.

Series Statement

Handbook of statistics, 0169-7161 ; v. 22

Uniform Title

Handbook of statistics (Amsterdam, Netherlands) ; v. 22.

Alternative Title

• Handbook of statistics 22
• Handbook of statistics vol 22
• Handbook of statistics volume 22

Subject

• Industrial engineering > Statistical methods
• Research, Industrial > Methodology
• Betriebswirtschaftliche Statistik
• Fertigung
• Forschung und Entwicklung
• Industriebetrieb
• PPS
• Statistik
• Statistische Qualitätskontrolle
• Industrie
• Statistische methoden
• Toepassingen
• Operations research

Genre/Form

Aufsatzsammlung.

Bibliography (note)

• Includes bibliographical references and index.

Contents

Ch. 1. Guidelines for Selecting and Factor Levels for an Industrial Designed Experiment / V. Czitrom -- Ch. 2. Industrial Experimentation for Screening / D.K.J. Lin -- Ch. 3. The Planning and Analysis of Industrial Selection and Screening Experiments / G. Pan, T.J. Santner and D.M. Goldsman -- Ch. 4. Uniform Experimental Designs and their Applications in Industry / K.-T. Fang and D.K.J. Lin -- Ch. 5. Mixed Models and Repeated Measures: Some Illustrative Industrial Examples / G.A. Milliken -- Ch. 6. Current Modeling and Design Issues in Response Surface Methodology: GLMs and Models with Block Effects / A.I. Khuri -- Ch. 7. A Review of Design and Modeling in Computer Experiments / V.C.P. Chen, K.-L. Tsui, R.R. Barton and J.K. Allen -- Ch. 8. Quality Improvement and Robustness via Design of Experiments / B.E. Ankenman and A.M. Dean -- Ch. 9. Software to Support Manufacturing Experiments / J.E. Reece -- Ch. 10. Statistics in the Semiconductor Industry / V. Czitrom -- Ch. 11. PREDICT: A New Approach to Product Development and Lifetime Assessment Using Information Integration Technology / J.M. Booker, T.R. Bement, M.A. Meyer and W.J. Kerscher III -- Ch. 12. The Promise and Challenge of Mining Web Transaction Data / S.R. Dalal, D. Egan, Y. Ho and M. Rosenstein -- Ch. 13. Control Chart Schemes for Monitoring the Mean and Variance of Processes Subject to Sustained Shifts and Drifts / Z.G. Stoumbos, M.R. Reynolds, Jr. and W.H. Woodall -- Ch. 14. Multivariate Control Charts: Hotelling T[superscript 2], Data Depth and Beyond / R.Y. Liu -- Ch. 15. Effective Sample Sizes for T[superscript 2] Control Charts / R.L. Mason, Y.-M. Chou and J.C. Young -- Ch. 16. Multidimensional Scaling in Process Control / T.F. Cox -- Ch. 17. Quantifying the Capability of Industrial Processes / A.M. Polansky and S.N.U.A. Kirmani -- Ch. 18. Taguchi's Approach to On-line Control Procedure / M.S. Srivastava and Y. Wu -- Ch. 19. Dead-Band Adjustment Schemes for On-line Feedback Quality Control / A. Luceno -- Ch. 20. Statistical Calibration and Measurements / H. Iyer -- Ch. 21. Subsampling Designs in Industry: Statistical Inference for Variance Components / R. Khattree -- Ch. 22. Repeatability, Reproducibility and Interlaboratory Studies / R. Khattree -- Ch. 23. Tolerancing -- Approaches and Related Issues in Industry / T.S. Arthanari -- Ch. 24. Goodness-of-fit Tests for Univariate and Multivariate Normal Models / D.K. Srivastava and G.S. Mudholkar -- Ch. 25. Normal Theory Methods and their Simple Robust Analogs for Univariate and Multivariate Linear Models / D.K. Srivastava and G.S. Mudholkar -- Ch. 26. Diagnostic Methods for Univariate and Multivariate Normal Data / D.N. Naik -- Ch. 27. Dimension Reduction Methods Used in Industry / G. Merola and B. Abraham -- Ch. 28. Growth and Wear Curves / A.M. Kshirsagar -- Ch. 29. Time Series in Industry and Business / B. Abraham and N. Balakrishna -- Ch. 30. Stochastic Process Models for Reliability in Dynamic Environments / N.D. Singpurwalla, T.A. Mazzuchi, S. Ozekici and R. Soyer -- Ch. 31. Bayesian Inference for the Number of Undetected Errors / S. Basu.

ISBN

• 0444506144
• 9780444506146

LCCN

2004296797

OCLC

• ocm51965882
• 51965882
• SCSB-1688795

Owning Institutions

Princeton University Library