Research Catalog
Surface scattering experiments with conduction electrons
- Title
- Surface scattering experiments with conduction electrons / Dieter Schumacher.
- Author
- Schumacher, Dieter
- Publication
- Berlin ; New York : Springer-Verlag, ©1993.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Book/Text | Use in library | Q111 .E7 vol.128 | Off-site |
Details
- Description
- 93 pages : illustrations; 24 cm.
- Summary
- Surface Scattering Experiments with Conduction Electrons shows how this process can be used to investigate surface processes of thin metal films. Since a thin film is in one direction of a size comparable to the mean free path of the conduction electrons, such a film is both substrate and sensor and must be characterized by other surface-analytical methodsas demonstrated here. Also discussed is how the dc-resistivity measurement permits the study of surface processes such as adsorption, desorption, and surface diffusion up to crystalline growth. The in situ observation of epitaxial growth is additionally shown to be possible. Thus the electronic structure of superimposed metal films and superlattices can be elucidated. This is an essential topic for all surface physicists.
- Series Statement
- Springer tracts in modern physics ; 128
- Uniform Title
- Springer tracts in modern physics ; 128.
- Subject
- Metallic films > Surfaces
- Thin films > Surfaces
- Conduction electrons
- Free electron theory of metals
- Dünne Schicht
- Elektrische Leitfähigkeit
- Elektronenstreuung
- Festkörperoberfläche
- Leitungselektron
- Metalloberfläche
- Metallschicht
- Oberfläche
- Röntgenstreuung
- Streuung
- Couches minces métalliques
- Surfaces (technologie)
- Électrons libres dans les métaux, Théorie des
- Bibliography (note)
- Includes bibliographical references (p. [85]-93) and index.
- Additional Formats (note)
- Also available in an electronic version.
- Contents
- 1. Introduction -- 2. The Electrical Conductivity of Thin Metal Films. 2.1. Characteristic Lengths. 2.2. Quantum Effects. 2.3. Film Structure. 2.4. Classical-Size Effect -- 3. Concepts to Describe the Surface Influence. 3.1. The Perfect Metal Vacuum Boundary. 3.2. Defects and Adsorbates. 3.3. Superimposed Films -- 4. Thin Metal Films on Glass Supports. 4.1. Preparation. 4.2. Characterization. 4.2.1. Electron Microscopy and Electron Diffraction. 4.2.2. X-ray Diffraction. 4.2.3. Scanning Tunnelling Microscopy. 4.2.4. Electrical Conductivity -- 5. Studies of Surface and Growth Processes. 5.1. Adsorption and Desorption. 5.2. Diffusion Processes. 5.3. Coverage Dependence. 5.4. Film Growth -- 6. Final Remarks.
- ISBN
- 3540561064
- 9783540561064
- 0387561064
- 9780387561066
- LCCN
- 92033496
- OCLC
- ocm26806776
- 26806776
- SCSB-1969398
- Owning Institutions
- Princeton University Library