Research Catalog
Reliability of gallium arsenide MMICs
- Title
- Reliability of gallium arsenide MMICs / edited by Aris Christou.
- Publication
- Chichester ; New York : Wiley, ©1992.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Use in library | TK7876 .R445 1992 | Off-site |
Details
- Additional Authors
- Christou, A.
- Description
- xx, 457 pages : illustrations; 26 cm.
- Series Statement
- Design and measurement in electronic engineering
- Uniform Title
- Design and measurement in electronic engineering.
- Subject
- Microwave integrated circuits > Reliability
- Microwave integrated circuits > Testing
- Gallium arsenide semiconductors > Reliability
- Gallium arsenide semiconductors > Testing
- Gallium arsenide semiconductors > Reliability
- Gallium arsenide semiconductors > Testing
- Microwave integrated circuits > Reliability
- Microwave integrated circuits > Testing
- Galliumarsenid-Bauelement
- Integrierte Mikrowellenschaltung
- Integrierte Schaltung
- Zuverlässigkeit
- Bibliography (note)
- Includes bibliographical references and index.
- Contents
- Chap. 1. Reliability and performance concerns of GaAs microwave monolithic integrated circuits / A. Christou -- Chap. 2. General reliability considerations as applied to MMICs / M. Pecht and P. Lall -- Chap. 3. Monolithic microwave integrated circuit reliability testing and analysis / A. Christou -- Chap. 4. The role of finite element analysis in CAD for MMIC reliability investigations / A. Dasgupta -- Chap. 5. Reliability issues of discrete FETs and HEMTs / F. Magistrali ... [et al.] -- Chap. 6. Surface-induced electromigration in GaAs devices / K. Bock, H. Hartnagel and J. Dumas -- Chap. 7. MMIC electromigration methodology / Pin Fang Zhou and Jian Hui Zhao -- Chap. 8. GaAs substrate mechanical reliability / J.M. Hu -- Chap. 9. MMIC thermal analysis / M.S. Fan -- Chap. 10. Thermally stable gate metallizations for GaAs / D.V. Morgan and J. Wood.
- (Cont.) Chap. 11. Reliability considerations for MMIC packages / A. Christou ... [et al.] -- Chap. 12. MMIC radiation effects / W.T. Anderson.
- ISBN
- 0471934909
- 9780471934905
- LCCN
- 92020386
- OCLC
- ocm26012843
- 26012843
- SCSB-9340854
- Owning Institutions
- Princeton University Library