Research Catalog
Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California
- Title
- Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California / D.E. Aspnes, S. So, R.F. Potter, editors.
- Publication
- Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, 1981.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Use in library | TK7871.85 .O6 | Off-site |
Holdings
Details
- Additional Authors
- Description
- x, 262 p. : ill.; 28 cm.
- Series Statement
- Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 276
- Subject
- Semiconductors > Congresses
- Bibliography (note)
- Includes bibliographical references and indexes.
- ISBN
- 0892523093 (pbk.)
- LCCN
- 81051404
- OCLC
- ocm07472758
- SCSB-9331533
- Owning Institutions
- Princeton University Library