Research Catalog

Quantitative microbeam analysis : proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992

Title
Quantitative microbeam analysis : proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992 / edited by A.G. Fitzgerald, B.E. Storey, D. Fabian.
Author
Scottish Universities Summer School in Physics (40th : 1992 : Dundee, Scotland)
Publication
Bristol : The School ; Philadelphia : Institute of Physics Pub., ©1993.

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Details

Additional Authors
  • Fitzgerald, A. G.
  • Storey, B. E.
  • Fabian, Derek J.
Description
xiv, 478 pages : illustrations; 24 cm.
Series Statement
SUSSP publications ; 40
Uniform Title
SUSSP publications ; 40.
Subject
  • Electron microscopy > Congresses
  • Electron probe microanalysis > Congresses
  • Electron microscopy
  • Electron probe microanalysis
  • Oppervlakken
  • Spectrometrie
  • Microscopie
  • Microscopie électronique > Congrès
  • Spectroscopie > Congrès
Genre/Form
Conference papers and proceedings.
Note
  • "A NATO Advanced Study Institute."
Bibliography (note)
  • Includes bibliographical references and index.
Contents
  • Quantification in AES and XPS / M.P. Seah -- Surface Analytical Imaging / M. Prutton -- Electronic Structure and Electron Spectroscopy / G. Van der Laan -- Auger Electron Spectroscopy in the STEM / P. Kruit -- Electron Energy-Loss Spectroscopy -- EELS / R.F. Egerton -- Light Element Microanalysis and Imaging / D.B. Williams -- A Comparison of Quantification Methods and Analytical Techniques / A.G. Fitzgerald -- Data Analysis and Processing / P. Trebbia -- Microscopy and Microanalysis of Insulating Materials / J. Cuzaux -- Electron Specimen Interactions / D.C. Joy -- Electron Probe X-ray Microanalysis / P. Van Espen -- Energy Dispersive X-Ray Analysis (EDX) in the TEM/STEM / J.M. Titchmarsh -- Analysis and Imaging by Proton-Induced X-Ray Emission (PIXE) / J.L. Campbell -- Ion-Beam Analytical Techniques -- Rutherford Backscattering, Elastic Recoil and Nuclear Reaction Analysis / E.A. Maydell -- Quantitative Analysis of Solids by SIMS and SNMS / K. Wittmaack -- Static SIMS / D. Briggs.
  • Applications of Surface, Interface and Thin Film Analysis in an Industrial Research Laboratory / H.W. Werner -- Ion-Induced Auger Electron Emission From Solids / D.J. Fabian -- Resonance Ionisation Mass Spectrometry (RIMS) / K.W. Ledingham.
ISBN
  • 0750302569
  • 9780750302562
  • 9781351420525 (canceled/invalid)
LCCN
93193307
OCLC
  • ocm29637324
  • 29637324
  • SCSB-1997854
Owning Institutions
Princeton University Library