Research Catalog
Spectroscopic characterization techniques for semiconductor technology V : 25-26 March 1994, Los Angeles, California
- Title
- Spectroscopic characterization techniques for semiconductor technology V : 25-26 March 1994, Los Angeles, California / Orest J. Glembocki, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, Center for Advanced Technology for Ultrafast Photonic Materials and Applications, City University of New York.
- Publication
- Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1994.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Book/Text | Use in library | TK7871.85 .S636 1994 | Off-site |
Details
- Additional Authors
- Description
- v, 220 pages : illustrations; 28 cm
- Series Statement
- SPIE proceedings series ; v. 2141
- Uniform Title
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 2141.
- Subject
- Genre/Form
- Conference papers and proceedings.
- Kongress.
- Los Angeles (Calif., 1994)
- Bibliography (note)
- Includes bibliographical references and index.
- Contents
- Quantum well materials and structures -- Semiconductor device characterization -- Epitaxial growth characterization.
- ISBN
- 0819414360
- 9780819414366
- LCCN
- 93087142
- OCLC
- ocm30614159
- 30614159
- SCSB-2021179
- Owning Institutions
- Princeton University Library