Research Catalog

Spectroscopic characterization techniques for semiconductor technology V : 25-26 March 1994, Los Angeles, California

Title
Spectroscopic characterization techniques for semiconductor technology V : 25-26 March 1994, Los Angeles, California / Orest J. Glembocki, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, Center for Advanced Technology for Ultrafast Photonic Materials and Applications, City University of New York.
Publication
Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1994.

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Details

Additional Authors
  • Glembocki, O. J.
  • Society of Photo-optical Instrumentation Engineers.
  • City University of New York. Center for Advanced Technology for Ultrafast Photonic Materials and Applications.
Description
v, 220 pages : illustrations; 28 cm
Series Statement
SPIE proceedings series ; v. 2141
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2141.
Subject
  • Semiconductors > Characterization > Congresses
  • Semiconductors > Testing > Congresses
  • Spectrum analysis > Congresses
  • Semiconductors > Characterization
  • Semiconductors > Testing
  • Spectrum analysis
  • Halbleitertechnologie
  • Spektroskopie
Genre/Form
  • Conference papers and proceedings.
  • Kongress.
  • Los Angeles (Calif., 1994)
Bibliography (note)
  • Includes bibliographical references and index.
Contents
Quantum well materials and structures -- Semiconductor device characterization -- Epitaxial growth characterization.
ISBN
  • 0819414360
  • 9780819414366
LCCN
93087142
OCLC
  • ocm30614159
  • 30614159
  • SCSB-2021179
Owning Institutions
Princeton University Library