Research Catalog

Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts

Title
Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts / Donald J. Svetkoff, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
Publication
Bellingham, Wash., USA : SPIE, c1995.

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Book/TextUse in library TA1632 .I443 1995Off-site

Details

Additional Authors
  • Svetkoff, Donald J.
  • Society of Photo-Optical Instrumentation Engineers.
Description
vii, 276 p. : ill.; 28 cm.
Series Statement
SPIE proceedings series ; v. 2348
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2348.
Subject
  • Computer vision > Congresses
  • Optical detectors > Congresses
  • Measurement > Industrial applications > Congresses
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0819416835
LCCN
94067545
OCLC
  • ocm31914983
  • SCSB-2040520
Owning Institutions
Princeton University Library