Research Catalog
Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts
- Title
- Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts / Donald J. Svetkoff, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Publication
- Bellingham, Wash., USA : SPIE, c1995.
Items in the Library & Off-site
Filter by
1 Item
Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Use in library | TA1632 .I443 1995 | Off-site |
Details
- Additional Authors
- Description
- vii, 276 p. : ill.; 28 cm.
- Series Statement
- SPIE proceedings series ; v. 2348
- Uniform Title
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 2348.
- Subject
- Bibliography (note)
- Includes bibliographical references and index.
- ISBN
- 0819416835
- LCCN
- 94067545
- OCLC
- ocm31914983
- SCSB-2040520
- Owning Institutions
- Princeton University Library