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Displaying 1-2 of 2 results for author "Adams, Richard R."
Close-range photogrammetric measurement of static defections for an aeroelastic supercritical wing [microform] / Thomas A. Byrdsong, Richard R. Adams, and Maynard C. Sandford
- Text
- [Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division ; [Springfield, Va. : National Technical Information Service, distributor], 1990.
- 1990
Analytical and photogrammetric characterization of a planar tetrahedral truss [microform] / K. Chauncey Wu, Richard R. Adams, and Marvin D. Rhodes.
- Text
- [Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division ; [Springfield, Va. : For sale by the National Technical Information Service], 1990.
- 1990
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