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Displaying 1-1 of 1 results for author "Bin, Eyal."
Hardware and software, verification and testing : first International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005 : revised selected papers / Shmuel Ur, Eyal Bin, Yaron Wolfsthal (eds.).
- Text
- Berlin ; New York : Springer, 2006.
- 2006
- 2 Items
Item details Format Call Number Item Location Text Off-site Not available - Please for assistance.Item details Format Call Number Item Location Text QA76.76.V47 H37 2005g Off-site
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