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  • Using model checking to generate tests from specifications [microform] / Paul E. Ammann, Paul E. Black, William Majurski.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1998]
    • 1998

  • A specification-based coverage metric to evaluate test sets [microform] / Paul E. Ammann, Paul E. Black.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1999]
    • 1999

  • Abstracting formal specifications to generate software tests via model checking [microform] / Paul E. Ammann, Paul E. Black.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1999]
    • 1999

  • A rational foundation for software metrology / David Flater; Paul E. Black; Elizabeth Fong; Raghy Kacker; Vadim Okum; Stephen Wood; D. Richard Kuhn.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.
    • 2016
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo96077

  • Proceedings of defining the state of the art in software security tools workshop / Paul E. Black (workshop chair), Elizabeth Fong (editor).

    • Text
    • [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology, [2005]
    • 2005
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo103154

  • Proceedings of the static analysis summit / Paul E. Black, Helen Gill, W. Bradley Martin (co-chairs), Elizabeth Fong (editor).

    • Text
    • [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology, [2006]
    • 2006
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo104740

  • Proceedings of workshop on software security assurance tools, techniques and metrics / Paul E. Black (workshop Chair), Michael Kass (Co-chair), Elizabeth Fong (editor).

    • Text
    • [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology, [2006]
    • 2006
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo98814

  • Report on the static analysis tool exposition (SATE) IV / Vadim Okun ... [and others].

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013.
    • 2013
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo100236

  • Static analysis tool exposition (SATE) 2008 / vadim Okun, Romain Gaucher, Paul E. Black.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2009.
    • 2009
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo101850

  • Report on the third static analysis tool exposition (SATE 2010) / vadim Okun, Aurelien Delaitre, Paul E. Black.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2011.
    • 2011
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo97080

  • The second static analysis tool exposition (SATE) 2009 / vadim Okun, Aurelien Delaitre, Paul E. Black.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2010.
    • 2010
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo98159

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