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Displaying 1-2 of 2 results for author "Bowyer, K. W."
Overview of the multiple biometrics grand challenge / P. J. Phillips; H. A. Sahibzada; P. J. Flynn; K. W. Bowyer; A. O'Toole; S. Weimer; J. R. Beveridge; B. Draper; D. Bolme; G. H. Givens; Y. M. Lui; J. A. Scallan; W. T. Scruggs.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2009.
- 2009
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo95501Empirical evidence for increased false reject rate with time lapse in ICE 2006 / S. E. Baker; K. W. Bowyer; P. J. Flynn; P. J. Phillips.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2011.
- 2011
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo96544
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