Research Catalog

  • Flywheel rotor safe-life technology [microform] : literature search summary / J.K.H. Ratner, J.B. Chang, and D.A. Christopher.

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : For sale by the National Technical Information Service, 2002]
    • 2002
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS60575
  • Methods and models for predicting fatigue crack growth under random loading / sponsored by ASTM Subcommittee E24.06 on Fracture Mechanics Applications, American Society for Testing and Materials ; J.B. Chang and C.M. Hudson, editors.

    • Text
    • Philadelphia, Pa. (1916 Race St., Philadelphia 19103) : ASTM, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text VEE ( American Society for Testing and Materials. Special technical publication. STP 748)Offsite
  • Composite structures damage tolerance analysis methodologies / James B. Chang ... [and others].

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2012]
    • 2012
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo27798
  • Damage tolerance of metallic structures : analysis methods and applications : a symposium / sponsored by ASTM Committee E-24 on Fracture Testing, Los Angeles, CA, 29 June 1981 ; James B. Chang and James L. Rudd, editors.

    • Text
    • Philadelphia, PA (1916 Race St., Philadelphia 19103) : American Society for Testing and Materials, c1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text TL671.6 .D36 1984Off-site
  • Methods and models for predicting fatigue crack growth under random loading / sponsored by ASTM Subcommittee E24.06 on Fracture Mechanics Applications, American Society for Testing and Materials ; J.B. Chang and C.M. Hudson, editors.

    • Text
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text TA418.38 .M47Off-site
    Not available - Please for assistance.

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