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Displaying 1-2 of 2 results for author "Chim, Wai Kin."
Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore] / edited by M.K. Radhakrishnan, Philip Ho, Wai Kin Chim ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter [and others].
- Text
- Piscataway, NJ : Institute of Electrical and Electronics Engineers, 1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I584 1997g Off-site Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99 : 5-9 July, 1999, Orchard Hotel, Singapore] / edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter [and others].
- Text
- Piscataway, New Jersey : IEEE, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I684 1999g Off-site
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