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Displaying 1-11 of 11 results for author "Creath, Katherine."
Defocus measurement using a liquid crystal point diffraction interferometer [microform] / Carolyn R. Mercer and Katherine Creath.
- Text
- [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1994]
- 1994
A phase-stepped point diffraction interferometer using liquid crystals [microform] / Carolyn R. Mercer, Katherine Creath, Nasser Rashidnia.
- Text
- [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
- 1995
High data density temperature measurement for quasi steady-state flows [microform] / Carolyn R. Mercer, Nasser Rashidnia, Katherine Creath.
- Text
- [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
- 1995
The nature of light [electronic resource] : what is a photon? / edited by Chandrasekhar Roychoudhuri, A.F. Kracklauer, Katherine Creath.
- Text
- Boca Raton : CRC Press, c2008.
- 2008
- 1 Item
Available Online
http://www.engnetbase.com/books/7165/44249_c000.pdfItem details Format Call Number Item Location Text JSE 08-583 Offsite Not available - Please for assistance.Interferometry : surface characterization and testing : 24 July 1992, San Diego, California / Katherine Creath, John E. Greivenkamp, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : SPIE, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text QC410.9 .I58 1992g Off-site Not available - Please for assistance.Interferometry XI : techniques and analysis, 8-10 July 2002, Seattle USA / Katherine Creath, Joanna Schmit, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, The Boeing Company (USA) [and others].
- Text
- Bellingham, Wash., USA : SPIE, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text QC410.9 .I583 2002g Off-site Not available - Please for assistance.Interferometry XII : techniques and analysis : 2-3 August, 2004, Denver Colorado, USA / Katherine Creath, Joanna Schmit, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by CPIA--Colorado Phoronics Industry Association.
- Text
- Bellingham, Wash. : SPIE, [2004], ©2004.
- 2004-2004
- 1 Item
Item details Format Call Number Item Location Text QC410.9 .I583 2004g Off-site Not available - Please for assistance.Surface characterization and testing : 21-22 August 1986, San Diego, California / Katherine Creath, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville [and others].
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1987], ©1987.
- 1987-1987
- 1 Item
Item details Format Call Number Item Location Text QC367 .S92 1987 Off-site Not available - Please for assistance.Interferometry : surface characterization and testing : 24 July 1992, San Diego, California / Katherine Creath, John E. Greivenkamp, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- 1992
- 1 Item
Item details Format Call Number Item Location Text QC410.9.I574 1992 Off-site Not available - Please for assistance.Surface characterization and testing / Katherine Creath, chair/editor ; sponsored by SPIE--the International Society for Optical engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville ... [et al.], 21-22 August 1986, San Diego, California.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text TA418.7 .S79 1987 Off-site Not available - Please for assistance.Interferometry : surface characterization and testing : 24 July 1992, San Diego, California / Katherine Creath, John E. Greivenkamp, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. USA : SPIE--the International Society for Optical Engineering, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text QC410.9 .I574 1992 Off-site Not available - Please for assistance.
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