Research Catalog

  • Proceedings / International Conference on Pattern Recognition.

    • Text
    • [New York] : Institute of Electrical and Electronics Engineers, c1980-
    • 1980-present
    • 11 Items
    FormatCall NumberItem Location
    Text JSP 83-31 1994:v. 1 Offsite
    Not available - Please for assistance.
    FormatCall NumberItem Location
    Text JSP 83-31 1994:v. 2 Offsite
    Not available - Please for assistance.
    FormatCall NumberItem Location
    Text JSP 83-31 1994:v. 3 Offsite
    Not available - Please for assistance.
  • Angewandte Szenenanalyse : DAGM Symposium, Karlsruhe, 10.-12. Oktober 1979 / hrsg. von J. P. Foith.

    • Text
    • Berlin ; Heidelberg ; New York : Springer, 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 84-841Offsite
    Not available - Please for assistance.

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