Research Catalog

  • Handbook of Auger electron spectroscopy : a reference book of standard data for identification and interpretation of Auger electron spectroscopy data / by Lawrence E. Davis ... [et al.]. 2d ed.

    • Text
    • Eden Prairie, Minn. : Physical Electronics Industries, c1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 77-142Offsite
  • Applied surface analysis : a symposium / sponsored by ASTM Committee E-42 on Surface Analysis, American Society for Testing and Materials, Cleveland, Ohio, 28 Feb.-1 March, 1978 ; T.L. Barr, L.E. Davis, editors.

    • Text
    • Philadelphia, Pa. : ASTM, c1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text VEE (American Society for Testing Materials. Special technical publication. no. 699)Offsite
  • Modern surface analysis : metallurgical applications of Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) : a TMS-AIME short course, Las Vegas, Nevada, Februrary 23-24, 1980 / L.E. Davis, course coordinator.

    • Text
    • Warrendale, Pa. : The Metallurgical Society of AIME, c1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text QC454.E4 M6Off-site
  • Handbook of Auger electron spectroscopy : a reference book of standard data for identification and interpretation of Auger electron spectroscopy data / by Lawrence E. Davis ... [et al.].

    • Text
    • Eden Prairie, Minn. : Physical Electronics Industries, c1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text QC793.5.E627 H36 1976Off-site
  • Applied surface analysis : a symposium / sponsored by ASTM Committee E-42 on Surface Analysis, American Society for Testing and Materials, Cleveland, Ohio, 28 Feb.-1 March, 1978 ; T. L. Barr, L. E. Davis, editors.

    • Text
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text TA418.7 .A68Off-site
    Not available - Please for assistance.
  • Applied surface analysis : a symposium / sponsored by ASTM Committee E-42 on Surface Analysis, American Society for Testing and Materials, Cleveland, Ohio, 28 Feb.-1 March, 1978 ; T. L. Barr, L. E. Davis, editors.

    • Text
    • Philadelphia, Pa. : ASTM, c1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text TA418.7 .A68Off-site

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