Research Catalog

  • Imaging spectrometry : 17-18 April 1995, Orlando, Florida / Michael R. Descour [and others], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [1995], ©1995.
    • 1995-1995
    • 1 Item
    FormatCall NumberItem Location
    Text TA1505 .I46 1995gOff-site
  • Three-dimensional and unconventional imaging for industrial inspection and metrology : 23-25 October 1995, Philadelphia, Pennsylvania / Michael R. Descours, Kevin G. Harding, Donald J. Svetkoff, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [1996], ©1996.
    • 1996-1996
    • 1 Item
    FormatCall NumberItem Location
    Text TA1637 .T48 1996gOff-site
  • Imaging spectrometry II : 7-8 August 1996, Denver, Colorado / Michael R. Descour, Jonathan M. Mooney chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering ; Cooperating Organizations NARSIA--North American Remote Sensing Industries Association, ASPRS--American Society for Photogrammetry and Remote Sensing.

    • Text
    • Bellingham, Wash. : SPIE, [1996], ©1996.
    • 1996-1996
    • 1 Item
    FormatCall NumberItem Location
    Text TA1505 .I46 1996gOff-site
  • Imaging spectrometry III : 28-30 July 1997, San Diego, California / Michael R. Descour, Sylvia S. Shen, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, 1997.
    • 1997
    • 1 Item
    FormatCall NumberItem Location
    Text TA1505 .I46 1997gOff-site
  • Imaging spectrometry IV : 20-21 July, 1998, San Diego, California / Michael R. Descour, Sylvia S. Shen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Washington : SPIE, [1998], ©1998.
    • 1998-1998
    • 1 Item
    FormatCall NumberItem Location
    Text TK8315 .I4653 1998Off-site
  • Imaging spectrometry VI : 31 July-2 August, 2000, San Diego, [California] USA / Michael R. Descour, Sylvia S. Shen, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organization, the Remote Sensing Society.

    • Text
    • Bellingham, Washington : SPIE, [2000], ©2000.
    • 2000-2000
    • 1 Item
    FormatCall NumberItem Location
    Text TA1505 .I46 2000gOff-site
  • Functional integration of opto-electro-mechanical devices and systems : 24-25 January 2001, San Jose, USA / Michael R. Descour, Juha T. Rantala, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text TK7875 .F86 2001gOff-site
  • Imaging spectrometry VII : 1-3 August 2001, San Diego, USA / Michael R. Descour, Sylvia S. Shen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : SPIE, [2002], ©2002.
    • 2002-2002
    • 1 Item
    FormatCall NumberItem Location
    Text TA1505 .I46 2002gOff-site
  • Functional integration of opto-electro-mechanical devices and systems II : 23-24 January 2002, San Jose, USA / Michael R. Descour, Juha T. Rantala, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [2002], ©2002.
    • 2002-2002
    • 1 Item
    FormatCall NumberItem Location
    Text TK7875 .F86 2002gOff-site
  • Three-dimensional and unconventional imaging for industrial inspection and metrology : 23-25 October 1995, Philadelphia, Pennsylvania / Michael R. Descours, Kevin G. Harding, Donald J. Svetkoff, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text TK8315 .T473 1996Off-site
  • Imaging spectrometry II : 7-8 August 1996, Denver, Colorado / Michael R. Descour, Jonathan M. Mooney chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, NARSIA--North American Remote Sensing Industries Association, ASPRS--American Society for Photogrammetry and Remote Sensing.

    • Text
    • Bellingham, Wash. : SPIE, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text TA1505 .P762 vol.2819Off-site
  • Three-dimensional and unconventional imaging for industrial inspection and metrology : 23-25 October 1995, Philadelphia, Pennsylvania / Michael R. Descour, Kevin G. Harding, Donald J. Svetkoff, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text TK8315 .T473 1996Off-site
  • Imaging spectrometry II : 7-8 August 1996, Denver, Colorado / Michael R. Descour, Jonathan M. Mooney chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, NARSIA--North American Remote Sensing Industries Association, ASPRS--American Society for Photogrammetry and Remote Sensing.

    • Text
    • Bellingham, Wash. : SPIE, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text TA1505 .P762 vol.2819Off-site
  • Imaging spectrometry : 17-18 April 1995, Orlando, Florida / Michael R. Descour ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering.

    • Text
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text TK8315 .I523 1995Off-site
  • Imaging spectrometry : 17-18 April 1995, Orlando, Florida / Michael R. Descour ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text TK8315 .I523 1995Off-site

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