Research Catalog

  • Technical progress bulletin [microform] / Center for Electronics and Electrical Engineering.

    • Text
    • Gaithersburg, Md. : U.S. Dept. of Commerce, National Engineering Laboratory
    • 1982-present
  • Measurements for competitiveness in electronics [microform] / prepared by the Electronics and Electrical Engineering Laboratory.

    • Text
    • Gaithersburg, MD : The Laboratory ; Springfield, VA : National Technical Information Service [distributor, 1993]
    • 1993
  • Programs, activities, and accomplishments [microform] / Semiconductor Electronics Division.

    • Text
    • [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
    • unknown-present
  • Programs, activities, and accomplishments [microform] / Office of Law Enforcement Standards.

    • Text
    • [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
    • unknown-present
  • EEEL ... technical accomplishments [microform] / Electronics and Electrical Engineering Laboratory, National Institute of Standards and Technology.

    • Text
    • Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
    • 1993-present
  • Programs, activities, and accomplishments / Office of Microelectronics Programs.

    • Text
    • [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
    • 19-20
    • 2 Resources

    Available Online

    See All Available Online Resources

  • DC conductivity measurements of metals [microform] / Michael D. Janezic ... [et al.].

    • Text
    • [Boulder, Colo.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, D.C. : For sale by the Supt. of Docs., U.S. G.P.O., [2004]
    • 2004
  • Programs, activities, and accomplishments / Office of Law Enforcement Standards.

    • Text
    • [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
    • 19-20
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/LPS28713
  • Semiconductor factory and equipment clock synchronization for e-manufacturing / Ya-Shian Li, Brad Van Eck.

    • Text
    • [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology, [2004]
    • 2004
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo98859
  • Programs, activities, and accomplishments / Semiconductor Electronics Division.

    • Text
    • [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
    • 200-2007
    • 2 Resources

    Available Online

    See All Available Online Resources

  • National Semiconductor Metrology Program : [catalog] / EEEL, Semiconductor Electronics Division, Office of Microelectronics Programs [i.e. National Semiconductor Metrology Program].

    • Text
    • Gaithersburg, MD : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, 1995-
    • 1995-present
    • 6 Items
    FormatCall NumberItem Location
    Text C 13.37:103/ 1998Off-site
    FormatCall NumberItem Location
    Text C 13.37:103/ 1999Off-site
    FormatCall NumberItem Location
    Text C 13.37:103/ 2000Off-site
  • National Semiconductor Metrology Program : [catalog] / EEEL, Semiconductor Electronics Division, Office of Microelectronics Programs [i.e. National Semiconductor Metrology Program].

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995-
    • 1995-present
    • 2 Items
    FormatCall NumberItem Location
    Text C 13.37:103 1998Off-site
    FormatCall NumberItem Location
    Text C 13.37:103 2000Off-site

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