Research Catalog

  • Electronic thin film science : for electrical engineers and materials scientists / King-Ning Tu, James W. Mayer, Leonard C. Feldman ; [illustrations provided by the authors].

    • Text
    • New York : Macmillan ; Toronto : Maxwell Macmillan Canada ; New York : Maxwell Macmillan International, [1992], ©1992.
    • 1992-1992
    • 1 Item
    FormatCall NumberItem Location
    Text QC176.9.M84 T83 1992Off-site
  • Fundamentals of nanoscale film analysis / T.L. Alford, L. Feldman and J.W. Mayer.

    • Text
    • New York, N.Y. ; London : Springer, [2007], ©2007.
    • 2007-2007
    • 1 Item
    FormatCall NumberItem Location
    Text TA418.9.N35 A54 2007gOff-site
  • Thin film processing and characterization of high-temperature superconductors : Anaheim, CA 1987 / editors, James M.E. Harper, Richard J. Colton, Leonard C. Feldman.

    • Text
    • New York : American Institute of Physics, [1988], ©1988.
    • 1988-1988
    • 1 Item
    FormatCall NumberItem Location
    Text QC612.S8 T47 1988gOff-site
  • Thin film processing and characterization of high-temperature superconductors, Anaheim, CA, 1987 / editors, James M.E. Harper, Richard J. Colton, Leonard C. Feldman.

    • Text
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text QC611.9 .T47 1988Off-site
  • Electronic thin film science : for electrical engineers and materials scientists / King-Ning Tu, James W. Mayer, Leonard C. Feldman ; [illustrations provided by the authors].

    • Text
    • New York : Macmillan ; Toronto : Maxwell Macmillan Canada ; New York : Maxwell Macmillan International, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text QC176.9.M84 T83 1992Off-site
  • Thin film processing and characterization of high-temperature superconductors, Anaheim, CA, 1987 / editors, James M.E. Harper, Richard J. Colton, Leonard C. Feldman.

    • Text
    • New York : American Institute of Physics, 1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text QC611.9 .T47 1988Off-site

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