Research Catalog

  • High temperature strain measurement with a resistance strain gage [microform] / Jih-Fen Lei and Ed Fichtel and Amos McDaniel.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1993]
    • 1993

No results found from Digital Research Books Beta

Digital books for research from multiple sources world wide- all free to read, download, and keep. No Library Card is Required. Read more about the project.

digital-research-book
Explore Digital Research Books Beta