Research Catalog

  • Optical inspection and micromeasurements : 10-14 June 1996, Besançon, France / Christophe Gorecki, chair/editor ; sponsored by CNRS--Centre national de la recherche scientifique [and others].

    • Text
    • Bellingham, Wash. : SPIE, [1996], ©1996.
    • 1996-1996
    • 1 Item
    FormatCall NumberItem Location
    Text TS156.2 .O64 1996gOff-site
  • Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG / Christophe Gorecki, chair/editor ; sponsored by EOS--The European Optical Society, SPIE--The International Society for Optical Engineering [and] The Commission of the European Communities, Directorate General for Science, Research, and Development.

    • Text
    • Bellingham, Wash., USA : SPIE, [1997], ©1997.
    • 1997-1997
    • 1 Item
    FormatCall NumberItem Location
    Text TS156.2 .O64 1997gOff-site
  • Microsystems engineering : metrology and inspection III : 23-25 June, 2003, Munich, Germany / Christophe Gorecki, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by, EOS--European Optical Society, WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany).

    • Text
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text TS156.2 .M52 2003gOff-site
  • Optical micro- and nanometrology in manufacturing technology : 29-30 April, 2004, Strasbourg, France / Christophe Gorecki, Anand K. Asundi, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [2004], ©2004.
    • 2004-2004
    • 1 Item
    FormatCall NumberItem Location
    Text TA1505 .O674 2004gOff-site
  • Optical inspection and micromeasurements : 10-14 June, Besançon, France / Christophe Gorecki, chair/editor ; sponsored by CNRS--Centre national de la recherche scientifique ... [et al.].

    • Text
    • Bellingham, Wash. : SPIE, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text TA1505 .P762 vol.2782Off-site
  • Optical measurements and sensors for the process industries : 20-22 June 1994, Frankfurt, FRG / Christophe Gorecki, Richard W.T. Preater, chairs/editors ; sponsored by the Commission of the European Communities, Directorate General for Science, Research, and Development, EOS--the European Optical Society, SPIE--the International Society for Optical Engineering.

    • Text
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TA1522 .O675 1994Off-site
  • Optical inspection and micromeasurements : 10-14 June 1996, Besançon, France / Christophe Gorecki, chair/editor ; sponsored by CNRS--Centre national de la recherche scientifique [and others].

    • Text
    • Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text TA1505 .P762 vol.2782Off-site
  • Optical measurements and sensors for the process industries : 20-22 June 1994, Frankfurt, FRG / Christophe Gorecki, Richard W.T. Preater, chairs/editors ; sponsored by the Commission of the European Communities, Directorate General for Science, Research, and Development, EOS--the European Optical Society, SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : SPIE, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TA1522 .O675 1994Off-site

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