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Displaying 1-5 of 5 results for author "Granger, Edward M."
Image quality, an overview : April 9-10, 1985, Arlington, Virginia / Edward M. Granger, Lionel R. Baker, chairmen/editors ; cosponsored by Sira Ltd.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1985], ©1985.
- 1985-1985
- 1 Item
Item details Format Call Number Item Location Text TK8315 .I45 1985 Off-site Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida / Edward M. Granger, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville.
- Text
- Bellingham, Wash., USA : The Society, [1987], ©1987.
- 1987-1987
- 1 Item
Item details Format Call Number Item Location Text TA1750 .M47 1987g Off-site Image quality : an overview, April 9-10, 1985, Arlington, Virginia / Edward M. Granger, Lionel R. Baker, chairmen, editors ; cosponsored by Sira Ltd.--the Research Association for Instrumentation.
- Text
- Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text TA1632 .I475 Off-site Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida / Edward M. Granger, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville.
- Text
- Bellingham, Wash., USA : the Society, c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text TA1750 .M47 Off-site Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida / Edward M. Granger, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville.
- Text
- Bellingham, Wash., USA : the Society, c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text TA1750 .M47 Off-site
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