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Displaying 1-4 of 4 results for author "IEEE Reliability/CPMT/ED Singapore Chapter."
Proceedings of 2nd Electronic Packaging Technology Conferenc : [8-10 December, 1998, Raffles City Convention Center, Singapore] / edited by Andrew A.O. Tay, Lim Thian Beng ; organised by IEEE Reliability/CPMT/ED Singapore Chapter [and others].
- Text
- Piscataway, New Jersey : IEEE, [1998], ©1998.
- 1998-1998
- 1 Item
Item details Format Call Number Item Location Text TK7870.15 .E453 1998g Off-site Proceedings of the ... Electronic Packaging Technology Conference / organised by IEEE CPMT Singapore Chapter ; technically co-sponsored by IEEE CPMT Society ; sponsored by Institute of Materials Research and Engineering [and] Institute of Microelectronics ; supported by ASME Singapore Section [and others].
- Text
- Piscataway, NJ : Institute of Electrical and Electronics Engineers, ©1997-
- 1997-present
- 3 Items
Item details Format Call Number Item Location Text TK7870.15 .E426a 3rd (2000) Off-site Item details Format Call Number Item Location Text TK7870.15 .E426a 4th (2002) Off-site Item details Format Call Number Item Location Text TK7870.15 .E426a 5th (2003) Off-site Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2002 / edited by John Thong [and others] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in cooperation with Centre for IC Failure Analysis & Reliability, National University of Singapore.
- Text
- Piscataway, New Jersey : IEEE, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I584 2002g Off-site Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2003 : [scheduled: 7 to 11 July, 2003, Singapore] / edited by Philip Ho ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in cooperation with Centre for IC Failure Analysis & Reliability, National University of Singapore.
- Text
- 2003
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I584 2003g Off-site
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