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  • DEPEND [microform] : a simulation-based environment for system level dependability analysis / Kumar Goswami and Ravishankar K. Iyer.

    • Text
    • [Urbana, IL] : Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va.? : National Technical Information Service, distributor, 1992]
    • 1992

  • Measurement and analysis of operating system fault tolerance [microform] / Inhwan Lee, Dong Tang, and Ravishankar K. Iyer.

    • Text
    • Urbana, IL : Center for Reliable and High Performance Computing, Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1992]
    • 1992

  • Analysis of large system black box verification test data [microform] / Kenneth C. Clapp and Ravishankar K. Iyer.

    • Text
    • [Urbana-Champaign] ; Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign ; [Springfield, Va. : National Technical Information Service, distributor, 1993]
    • 1993

  • Predictability of process resource usage [microform] : a measurement-based study of UNIX / Murthy V. Devarakonda, Ravishankar K. Iyer.

    • Text
    • Urbana, Ill. : Computer Systems Group, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1987]
    • 1987

  • Usage analysis of user files in UNIX [microform] / Murthy V. Devarakonda, Ravishankar K. Iyer.

    • Text
    • Urbana, Ill. : Computer Systems Group, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1987]
    • 1987

  • FTAPE [microform] : a fault injection tool to measure fault torerance / Timothy K. Tsai and Ravishankar K. Iyer.

    • Text
    • [Washington, D.C.?] : American Institute of Aeronautics and Astronautics : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor], c1994.
    • 1994

  • Measuring fault tolerance with the FTAPE fault injection tool [microform] / Timothy K. Tsai and Ravishankar K. Iyer.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995?]
    • 1995

  • Fault injection techniques and tools [microform] / Mei-chen Hsueh, Timothy K. Tsai and Ravishankar K. Iyer.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration, 1997]
    • 1997-1997

  • DSIM, a distributed simulator [microform] : final report for NASA grant NCA-2-385 / Kumar K. Goswami and Ravishankar K. Iyer.

    • Text
    • Urbana, Ill. : Center for Reliable and High Performance Computing, Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign ; [Washington, D.C. : National Aeronautics and Space Administration, 1990]
    • 1990
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS62903

  • DEPEND [microform] : a design environment for prediction and evaluation of system dependability / Kumar K. Goswami and Ravishankar K. Iyer.

    • Text
    • [Urbana, IL] : Center for Reliable and High Performance Computing, Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign ; [Hampton, VA : NASA Langley ; Springfield, Va. : National Technical Information Service, distributor, 1990]
    • 1990
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS64093

  • Dependable computing for critical applications 5 / Ravishankar K. Iyer [and others].

    • Text
    • Los Alamitos, Calif. : IEEE Computer Society, 1998.
    • 1998
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.9.F38 I35 1997Off-site

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