Research Catalog

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  • Measurement uncertainties in speaker recognition evaluation / Jin Chu Wu; Alvin F. Martin; Craig S. Greenberg; Raghu N. Kacker.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2010.
    • 2010
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo104074

  • Further studies of bootstrap variability for ROC analysis on large datasets / Jin Chu Wu; Alvin F. Martin; Raghu N. Kacker.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2010.
    • 2010
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo101844

  • Validation of two-sample bootstrap in ROC analysis on large datasets using AURC / Jin Chu Wu; Alvin F. Martin; Raghu N. Kacker.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2010.
    • 2010
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo98689

  • Combinatorial coverage measurement / D. Richard Kuhn; Raghu N. Kacker; Yu Lei.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2012.
    • 2012
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo99610

  • Measurement uncertainty in cell image segmentation data analysis / Jin Chu Wu; Michael Halter; Raghu N. Kacker; John T. Elliott; Ann L. Plant.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013.
    • 2013
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo100218

  • Measurement uncertainties of three score distributions and two thresholds with data dependency / Jin Chu Wu; Alvin F. Martin; Craig S. Greenberg; Raghu N. Kacker.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.
    • 2014
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo99778

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