Research Catalog

  • A rational foundation for software metrology / David Flater; Paul E. Black; Elizabeth Fong; Raghy Kacker; Vadim Okum; Stephen Wood; D. Richard Kuhn.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.
    • 2016
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo96077

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