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Displaying 1-25 of 25 results for author "Kanal, Laveen N."
Pattern recognition; proceedings. Edited by Laveen N. Kanal.
- Text
- Washington, Thompson Book Co., 1968.
- 1968
- 1 Item
Item details Format Call Number Item Location Text JSE 72-744 Offsite Uncertainty in artificial intelligence / edited by Laveen N. Kanal and John F. Lemmer.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text JSE 88-1441 Offsite Search in artificial intelligence / Laveen Kanal, Vipin Kumar, editors.
- Text
- New York : Springer-Verlag, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JSE 89-654 Offsite Pattern recognition and artificial intelligence : towards an integration : proceedings of an international workshop held in Amsterdam, May 18-20, 1988 / edited by Edzard S. Gelsema and Laveen N. Kanal.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., USA : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JSD 91-55 Offsite Parallel algorithms for machine intelligence and vision / Vipin Kumar, P.S. Gopalakrishnan, Laveen N. Kanal, editors.
- Text
- New York : Springer-Verlag, c1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text JSE 91-1812 Offsite Parallel processing for artificial intelligence 1 / edited by Laveen N. Kanal ... [et al.].
- Text
- Amsterdam ; London : North-Holland, 1994.
- 1994
- 1 Item
Item details Format Call Number Item Location Text JSE 95-344 Offsite Report on the 1968 IEEE Workshop on Pattern Recognition, Delft, the Netherlands, August 12-16, 1968 / by B. Chandrasekaran, L. Kanal, and G. Nagy.
- Text
- New York : Institute of Electrical and Electronics Engineers, [1969]
- 1969
- 1 Item
Item details Format Call Number Item Location Text Q327 .I22 1968 Off-site Analysis and management of uncertainty : theory and applications / edited by Bilal M. Ayyub, Madan M. Gupta, Laveen N. Kanal.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text Q375 .A52 1992 Off-site Parallel processing for artificial intelligence / edited by Laveen N. Kanal [and others].
- Text
- Amsterdam ; New York : North-Holland, 1994-
- 1994-present
- 1 Item
Item details Format Call Number Item Location Text QA76.58 .P37775 1994 Off-site Pattern recognition ; proceedings / Edited by Laveen N. Kanal.
- Text
- Washington : Thompson Book Co., 1968.
- 1968
- 1 Item
Item details Format Call Number Item Location Text Q327 .I2 1966 Off-site Progress in pattern recognition / edited by Laveen N. Kanal and Azriel Rosenfeld.
- Text
- 1981-present
- 2 Items
Item details Format Call Number Item Location Text Q327 .P76 v. 2 Off-site Item details Format Call Number Item Location Text Q327 .P76 v. 1 Off-site Pattern recognition in practice II : proceedings of an international workshop held in Amsterdam, June 19-21, 1985 / edited by Edzard S. Gelsema and Laveen N. Kanal.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text Q327 .P378 1986 Off-site Uncertainty in artificial intelligence / edited by Laveen N. Kanal and John F. Lemmer.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text Q335 .U53 1986 Off-site Uncertainty in artificial intelligence 2 / edited by John F. Lemmer and Laveen N. Kanal.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text Q335 .U532 1988 Off-site Uncertainty in artificial intelligence 3 / edited by Laveen N. Kanal, Tod S. Levitt, John F. Lemmer.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text Q335 .U533 1989 Off-site Parallel algorithms for machine intelligence and vision / Vipin Kumar, P.S. Gopalakrishnan, Lavee N. Kanal, editors.
- Text
- New York : Springer-Verlag, [1990], ©1990.
- 1990-1990
- 1 Item
Item details Format Call Number Item Location Text QA76.5 .P31457 1990 Off-site Report / By B. Chandrasekaran, L. Kanal and G. Nagy.
- Text
- New York : Institute of Electrical and Electronics Engineers, 1969.
- 1969
- 1 Item
Item details Format Call Number Item Location Text QA96 12 1968 Off-site Pattern recognition in practice II : proceedings of an international workshop held in Amsterdam, June 19-21, 1985 / edited by Edzard S. Gelsema and Laveen N. Kanal.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text Q327 .P378 1986 Off-site Uncertainty in artificial intelligence / edited by Laveen N. Kanal and John F. Lemmer.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text Q335 .U53 1986 Off-site Pattern recognition in practice : proceedings of an international workshop held in Amsterdam, May 21-23, 1980 / edited by Edzard S. Gelsema and Laveen N. Kanal.
- Text
- Amsterdam ; New York : North-Holland Pub. Co. ; New York, N.Y. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text Q327 .P38 Off-site Search in artificial intelligence / Laveen Kanal, Vipin Kumar, editors.
- Text
- New York : Springer-Verlag, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text Q336 .S4 1988 Off-site Pattern recognition in practice II : proceedings of an international workshop held in Amsterdam, June 19-21, 1985 / edited by Edzard S. Gelsema and Laveen N. Kanal.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text Q327 .P378 1986 Off-site Uncertainty in artificial intelligence / edited by Laveen N. Kanal and John F. Lemmer.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text Q335 .U53 1986 Off-site Pattern recognition in practice : proceedings of an international workshop held in Amsterdam, May 21-23, 1980 / edited by Edzard S. Gelsema and Laveen N. Kanal.
- Text
- Amsterdam ; New York : North-Holland Pub. Co. ; New York, N.Y. : Sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text Q327 .P38 Off-site Search in artificial intelligence / Laveen Kanal, Vipin Kumar, editors.
- Text
- New York : Springer-Verlag, [1988]
- 1988-1988
- 1 Item
Item details Format Call Number Item Location Text Q336 .S4 1988 Off-site
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