Research Catalog
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Displaying 1-6 of 6 results for author "Ko, Kenneth."
User's guide to export controlled distribution of NIST biometric image software (NBIS-EC) / Craig I. Watson; Michael D. Garris; Elham Tabassi; Charles L. Wilson; R. Michael McCabe; Stanley Janet; Kenneth Ko.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2007.
- 2007
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo105345User's guide to NIST biometric image software (NBIS) / Craig I. Watson; Michael D. Garris; Elham Tabassi; Charles L. Wilson; R. Michael McCabe; Stanley Janet; Kenneth Ko.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2007.
- 2007
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo98589Effects of JPEG 2000 image compression on 1000 ppi fingerprint imagery / Shahram Orandi; John M. Libert; John D. Grantham; Kenneth Ko; Stephen S. Wood; Jin Chu Wu.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2011.
- 2011
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo100379Examination of downsampling strategies for converting 1000 ppi fingerprint imagery to 500 ppi / Shahram Orandi; John M. Libert; Kenneth Ko; Stephen S. Wood; Stepehn G. Harvey; John D. Grantham; Margaret Lepley; Lindsay M. Petersen; Bruce Bandini.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013.
- 2013
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo95129Examination of the impact of fingerprint spatial area loss on matcher performance in various mobile identification scenarios / Shahram Orandi; Kenneth Ko; Stephen S. Wood; Michael D. Garris; John D. Grantham.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.
- 2014
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo101229Compression guidance for 1000 ppi friction ridge imagery / Shahram Orandi, John Libert, Kenneth Ko, Stephen Wood, Frederick Byers, Stephen Harvey, Michael Garris, John Grantham, Bruce Bandini.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.
- 2014
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo101980
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