Research Catalog

  • Analysis of a generally oriented crack in a functionally graded strip sandwiched between two homogeneous half planes [microform] / N. Shbeeb, W.K. Binienda, and K. Kreider.

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
    • 1999

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