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Displaying 1-9 of 9 results for author "Last, Mark."
Knowledge discovery and data mining : the info-fuzzy network (IFN) methodology / by Oded Maimon and Mark Last.
- Text
- Dordrecht ; London : Kluwer Academic, c2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Text JSF 01-243 Offsite Artificial intelligence methods in software testing / editors, Mark Last, Abraham Kandel, Horst Bunke.
- Text
- Singapore ; River Edge, NJ : World Scientific, c2004.
- 2004
- 1 Item
Item details Format Call Number Item Location Text JSE 04-1482 Offsite Data mining in time series databases. / editors, Mark Last, Abraham Kandel, Horst Bunke.
- Text
- New Jersey ; London : World Scientific, c2004.
- 2004
- 1 Item
Item details Format Call Number Item Location Text JSE 05-426 Offsite Fighting terror in cyberspace / editors Mark Last and Abraham Kandel.
- Text
- [Hackensack], N.J. : World Scientific, c2005.
- 2005
- 1 Item
Item details Format Call Number Item Location Text JFE 06-6904 Schwarzman Building - Main Reading Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Knowledge discovery and data mining : the info-fuzzy network (IFN) methodology / by Oded Maimon and Mark Last.
- Text
- Dordrecht ; London ; Boston : Kluwer Academic, ©20001 [i.e. ©2001]
- 2001
- 1 Item
Item details Format Call Number Item Location Text QA76.9.D343 M35 2001g Off-site Data mining and computational intelligence / Abraham Kandel, Mark Last, Horst Bunke, editors.
- Text
- Heidelberg ; New York : Physica-Verlag, [2001], ©2001.
- 2001-2001
- 1 Item
Item details Format Call Number Item Location Text QA76.76.E95 D38 2001 Off-site Data mining in time series databases. / editors, Mark Last, Abraham Kandel, Horst Bunke.
- Text
- New Jersey ; London : World Scientific, [2004], ©2004.
- 2004-2004
- 1 Item
Item details Format Call Number Item Location Text QA76.9 .D343 D3835 2004g Off-site Applied graph theory in computer vision and pattern recognition / Abraham Kandel, Horst Bunke, Mark Last (eds.).
- Text
- Berlin ; New York : Springer, 2007.
- 2007
- 1 Item
Item details Format Call Number Item Location Text TA1634 .A66 2007g Off-site Applied pattern recognition / Horst Bunke, Abraham Kandel, Mark Last, (eds.).
- Text
- Berlin : Springer, c2008.
- 2008
- 1 Item
Item details Format Call Number Item Location Text TK7882.P3 A665 2008 Off-site
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