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Displaying 1-2 of 2 results for author "Lim, Hong S."
Destructive physical analysis results of Ni/H₂ cells cycled in LEO regime [microform] / Hong S. Lim ... [et al.].
- Text
- [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1991]
- 1991
A prediction model of the depth-of-discharge effect on the cycle life of a storage cell [microform] / Lawrence H. Thaller and Hong S. Lim.
- Text
- Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center, 1987.
- 1987
- 1 Resource
Available Online
http://purl.access.gpo.gov/GPO/LPS93174
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