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Displaying 1-17 of 17 results for author "Longshore, Randolph E."
Growth and characterization of materials for infrared detectors and nonlinear optical switches : 2-3 April 1991, Orlando, Florida / Randolph E. Longshore, Jan W. Baars, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organization, CREOL/University of Central Florida.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1991], ©1991.
- 1991-1991
- 1 Item
Item details Format Call Number Item Location Text TA1570 .G76 1991g Off-site Growth and characterization of materials for infrared detectors : 15-16 July 1993, San Diego, California / Randolph E. Longshore, Jan W. Baars, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : SPIE, [1993], ©1993.
- 1993-1993
- 1 Item
Item details Format Call Number Item Location Text TA1570 .G76 1993g Off-site Growth and characterization of materials for infrared detectors II : 13-14 July, 1995, San Diego, California / Randolph E. Longshore [and others], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash. : SPIE, [1995], ©1995.
- 1995-1995
- 1 Item
Item details Format Call Number Item Location Text TA1570 .G76 1995g Off-site Materials for infrared detectors : 30 July-1 August 2001, San Diego, USA / Randolph E. Longshore, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [2001], ©2001.
- 2001-2001
- 1 Item
Item details Format Call Number Item Location Text TA1570 .M364 2001g Off-site Materials for infrared detectors II : 8-9 July, 2002, Seattle, Washington, USA / Randolph E. Longshore, Sivalingam Sivananthan, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) [and others].
- Text
- Bellingham, Wash. : SPIE, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text TA1570 .M364 2002g Off-site Future infrared detector materials : 29-30 March 1989, Orlando, Florida / Jan W. Baars, Randolph E. Longshore, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University [and others].
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1989], ©1989.
- 1989-1989
- 1 Item
Item details Format Call Number Item Location Text TA1570 .F88 1989g Off-site Growth and characterization of materials for infrared detectors II : 13-14 July 1995, San Diego, California / Randolph E. Longshore ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TA1570 .G7692 1995 Off-site Infrared detectors for remote sensing : physics, materials, and devices : 8-9 August 1996, Denver, Colorado / Randolph E. Longshore, Jan W. Baars, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations NARSIA--North American Remote Sensing Industries Association, ASPRS--American Society for Photogrammetry and Remote Sensing.
- Text
- Bellingham, Wash., USA : SPIE, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2816 Off-site Future infrared detector materials : 29-30 March 1989, Orlando, Florida / Jan W. Baars, Randolph E. Longshore, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.].
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text TA1570.F87 Off-site Growth and characterization of materials for infrared detectors and nonlinear optical switches : 2-3 April 1991, Orlando, Florida / Randolph E. Longshore, Jan W. Baars, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organization, CREOL/University of Central Florida.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1991.
- 1991
- 1 Item
Available Online
http://proceedings.spiedigitallibrary.org/volume.aspx?volume=1484Item details Format Call Number Item Location Text TA1570 .G768 1991 Off-site Growth and characterization of materials for infrared detectors : 15-16 July 1993, San Diego, California / Randolph E. Longshore, Jan W. Baars, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- 1993
- 1 Item
Item details Format Call Number Item Location Text TA1570 .G769 1993 Off-site Infrared detectors : state of the art II : 24-25 July 1994, San Diego, California / Randolph E. Longshore, chair/editor ; sponsored by SPIE--the Internatinal Society for Optical Engineering.
- Text
- 1994
- 1 Item
Item details Format Call Number Item Location Text TA1570 .I53392 Off-site Growth and characterization of materials for infrared detectors II : 13-14 July 1995, San Diego, California / Randolph E. Longshore ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TA1570 .G7692 1995 Off-site Infrared detectors for remote sensing : physics, materials, and devices : 8-9 August 1996, Denver, Colorado / Randolph E. Longshore, Jan W. Baars, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations NARSIA--North American Remote Sensing Industries Association, ASPRS--American Society for Photogrammetry and Remote Sensing.
- Text
- Bellingham, Wash., USA : SPIE, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2816 Off-site Growth and characterization of materials for infrared detectors and nonlinear optical switches : 2-3 April 1991, Orlando, Florida / Randolph E. Longshore, Jan W. Baars, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organization, CREOL/University of Central Florida.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text TA1570 .G768 1991 Off-site Growth and characterization of materials for infrared detectors : 15-16 July 1993, San Diego, California / Randolph E. Longshore, Jan W. Baars, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text TA1570 .G769 1993 Off-site Infrared detectors : state of the art II : 24-25 July 1994, San Diego, California / Randolph E. Longshore, chair/editor ; sponsored by SPIE--the Internatinal Society for Optical Engineering.
- Text
- Bellingham, Wash. USA : SPIE--the International Society for Optical Engineering, c1994.
- 1994
- 1 Item
Item details Format Call Number Item Location Text TA1570 .I53392 Off-site
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