Research Catalog

  • Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, c1991.
    • 1991
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 92-1899Offsite
  • Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, [1991], ©1991.
    • 1991-1991
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .M3443 1991Off-site

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