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Displaying 1-2 of 2 results for author "Mantey, Patrick E."
Image processing, analysis, measurement, and quality : 13-15 January 1988, Los Angeles, California : part of SPSE's International Symposium and Exposition on Electronic Imaging Devices and Systems '88, Andras I. Lakatos, general chair / Gary W. Hughes, Patrick E. Mantey, Bernice E. Rogowitz, chairs/editors ; sponsored by SPSE--the Society for Imaging Science and Technology, cosponsored by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : The Society, [1988], ©1988.
- 1988-1988
- 1 Item
Item details Format Call Number Item Location Text TA1632 .I458 1988 Off-site Image processing, analysis, measurement, and quality : 13-15 January 1988, Los Angeles, California : part of SPSE's International Symposium and Exposition on Electronic Imaging Devices and Systems '88, Andras I. Lakatos, general chair / Gary W. Hughes, Patrick E. Mantey, Bernice E. Rogowitz, chairs/editors ; sponsored by SPSE--the Society for Imaging Science and Technology, cosponsored by SPIE--the International Society for Optical Engineering.
- Text
- 1988
- 1 Item
Item details Format Call Number Item Location Text TA1632.I458 1988 Off-site
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